Test Flash Connector X

The Test Flash-Connector is used as a flash programming interface for updating (i.e. reprogramming) the flash program memory and as an electrical interface for access to the engine by service-tool (e.g. WinTesla). This Interface is typically used by Aftersale via a 'HDa12 Service battery' and by the FINUI- and Label- stations in the factory. The Connector is made as 4 Test Pads which are accessible through the mechanic of the phone when the Battery is removed.

When the flash programming-tool is connected to the phone (via 'Service battery'), supply power is provided through the battery contacts and the phone is powered up with an IBI-pulse given to the BTEMP line.

Note:ESD protection is applied to all pads of X201.

X400,SIM-Card Conn.

X400,SIM-Card Conn.

M400, Vibra Pads 1Q

Figure 2: Pad Number description

Table 2: Test Flash-Connector Electrical Specification

Pin

Name

Parameter

Min

Typ

Max

Unit

Remark

1

FBUS_TX

Data ack. to the Prommer

2.24

logic low logic high

0.62 2.85

V

Transmit Data from MAD2WD1 (AccTxData) to Prommer (@ VBB=2,85V)

2

FBUS_RX

Serial data from the Prommer

0 1,68

logic low logic high

0.84 2.85

V

Receive Data from Prommer to MAD2WD1 (AccRxData) (@ VBB=2,85V)

3

GND

GND

0

0

V

Ground

4

MBUS

Serial clock from the Prommer

0 1,68

logic low logic high

0.84 2.85

V

Prommer detection and Serial Clock for synch. Comm. to MAD2WD1 (MBUS) (@ VBB=2,85V)

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