Self Tests command

Activation Status Bar Text

Alt, E, S Open MCU Self-tests dialog box

The command is used for reading self test results and running self tests.

User is first requested to run self-tests in minimum mode, or to look powerup self-tests results with Test Type Selection dialog.

The Test Type Selection dialog has following items:

Test Type list box (ALT+S):

Power up self-test results

Shows power up self-test results in MCU Powerup Self-tests dialog.

Run Self-tests in minimum mode

Sets phone to minimum mode and opens MCU Self-tests dialog.

Technical Documentation

MCU Powerup Self-tests

When powerup self-tests are selected the test results are read from the phone and displayed in MCU Powerup Self-tests dialog. (Sample screen)

The MCU Powerup Self-tests dialog has following items:

When powerup self-tests are selected test results are read from phone and displayed in MCU Self-tests dialog.

Test states are updated according to the results received from the phone. Possible test states will be one of the next:

Passed

Failed

No response Not executed

Only on the fault value is indicated in the DSP self-test message. Note that DSP test results can be asked from DSP only when all MCU tests have been passed. Possible DSP error texts are:

RAM BUS Fault,

ASIC BUS Fault,

RFI BUS Fault,

Unknown and

Download Error.

NHE-1/3/4 Technical Documentation

When this selection is made Bus Test dialog is displayed. In this dialog are shown results from the first failed MCU BUS test. When none of MCU BUS tests has been failed this selection is disabled (greyed).

The field "(s)" means that this test is selectable one.

The following tests are available:

MCU Internal Test :

MCU ROM Data Test :

MCU ASIC Timer and IRQX Test..(s):

MCU Audio Codec Test (s):

MCU DSP Code Download Test :

MCU EEPROM Checksum Test :

Sim-Lock Checksum Test :

Technical Documentation

MCU Self Tests

When the selection is made, the test result is read from ME. The test result will be shown to the user within the MCU Self-test dialog box. (Sample screen)

The MCU Self-test dialog box contains the following items:

The field "(p)" in the screen example means that the test is also run in power up.

The field "/s)" means that this test is selectable one.

Test states are updated according to the results received from the phone. Possible test states will be one of the following:

Passed Failed

No response Not executed RUNNING

The user can select desired test from list and hit Run button. When user selects test to be run, the text RUNNING... is shown in the test state field, and test is run. When results are received, the test state field is updated according to the result.

If no response was received in the defined time, a error message box will be shown and the test state is changed to No response.

NHE-1/3/4 Technical Documentation

When this selection is made Bus Test dialog is displayed. In this dialog are shown results from the first failed MCU BUS test. When none of MCU BUS tests has been failed this selection is disabled (greyed).

The following tests are available:

MCU Internal Test (p):

ASIC Timer and IRQX Test (p/s):

ASIC Timer and NMI Test (p/s):

RAM Component Test :

Ext. ROM Checksum Test :

Display Driver Test :

ASIC Type Test :

EEPROM Component Test :

EEPROM Bus Test :

Software Reset Test :

Power Off Test

Failed BUS Test: MCU RDM BUS Test

Failed BUS Test: MCU RDM BUS Test

Address

Bin

Hex

zzzz

Written

tttttttttttttttt

tttt

Read

tttttttttttttttt

tttt

zzzz

Written

tttttttttttttttt

tttt

Read

tttttttttttttttt

tttt

zzzz

Written

tttttttttttttttt

tttt

Read

tttttttttttttttt

BUS Errors dialog has following items: Failed BUS Test static text: Name of the first failed MCU BUS test. Address Bin Hex static text:

This static text shows, what data was written and what was read from three different addresses. Values are given in binary and hexadecimal formats.

Technical Documentation

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